Array ( ) Array ( )
Prevac | PTS_CLEAV_RES_C_K_sample_holder PTS CLEAV RES/C-K sample holder
Prevac | Wobble_Stick_with_Parallel_Mobile_Tip Wobble Stick with Parallel Mobile Tip
Prevac | ION_Source_Control ION Source Control
Prevac | PV042 The ARPES system is a customised multi-chamber UHV system for the investigation of physical properties (electronic band structure) of high temperature superconductors.
Prevac | Linear_Feedthrough Linear Feedthrough
Keysight | Keysight_Nano_Indenter_G300 Keysight Nano Indenter G300
Keysight | 5420_AFM Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners,
Keysight | 8500-FE-SEM The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been optimized for low-voltage imaging, extremely high surface contrast and r
Keysight | Keysight_Nano_Indenter_G200 Keysight Nano Indenter G200
Keysight | 5100_AFM The Agilent 5100 AFM/SPM microscope is a high-resolution system that provides excellent imaging capabilities in an easy-to-upgrade package. It is ideal for polymer, general surface characterization and materials applications. The Agilent 5100 AFM/SPM micr